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When Deep Learning Meets IC Fabrication A Data

时间:2019-06-16 07:32   编辑:本站

When Deep Learning Meets IC Fabrication A Data

WhenDeepLearningMeetsICFabrication:AData-DrivenApproachtoICDesignforManufacturability 2019-05-15|【】  时间:2019年5月24日(周五)上午10:00  地点:计算所四层报告厅  报告人:(林嘉文),NationalTsingHuaUniversity,Taiwan  摘要:Traditionally,afterIDcircuitdesignandlayout,ittakesmonthstofabricateanICwafer,involvin,wewillshowhowdeep-lea,weformulatethelithographyandetchingprocessesofmetallayersasasetofnonlinearwarpingfunctionsbetweenapatchofIClayoutpatternanditscorrespondingSEMimage,andmodelsthesetofwarpingfunctionsusingaCNN-basedLithoNetparametrizedwithICfabricationparameters.  报告人简介:nalTsingHuaUniversity(NTHU),Hsinchu,,NTHU,,andDirectorofMultimediaTechnologyResearchCenteroftheEECSCollege,/videoprocessing,computervision,(CASS)tionAssociation,Taiwan(term:2019-2020).HehasservedasAssociateEditorofIEEETransactionsonImageProcessing,IEEETransactionsonMultimedia,IEEETransactionsonCircuitsandSystemsforVideoTechnology,,,andtheYoungInvestigatorAwardofVCIP2005.。